Customized automated solutions for inline process diagnostic and control
inline inspection from 2" - 12"

Clean room compatibility down to class 10

Integrated data analysis and automation software, fab communication by SECS interface

Twin Scanner for highest throughput

Arrays of 2 or more transducers for simultaneous image acquisition

Fast data acquisition by master/slave computer configuration, enabling of transducer arrays for maximum throughput

Wafer inspection station for
wafer handling in water
High speed robot for
wafers up to 200 mm
Pre-aligner and bar code
reader
Twin scanner with two
transducers

Transducers
Electronics
Stages
Software
Operation Principle
Scan Modes
Frequency, Wavelenght
Resolution
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