Discover the world of Scanning Acoustic Microscopes |
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optical image
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SAM images
of different layers |
SAM 3-D image
of the interior |
SAM image with delaminated areas
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The unique characteristic of Scanning Acoustic Microscopy is in the ability to examine nondestructive opaque materials and to inspect the interior of samples with the resolution of optical light microscopy.
New ways of thinking and visionary ideas are behind our successful concepts of trend-setting scanning acoustic microscopy technologies. In almost all fields of modern science and technology the demands for innovative, advanced solutions for non-destructive imaging with scanning acoustic microscopy has increased. PVA TePla Analytical Systems develops, produces and delivers scanning acoustic microscopes. Our unique transducers with frequencies from 3 to 2000 MHz extend imaging and analytical resolution beyond previously achievable limits. Kraemer Scientific Instruments GmbH and SAMTEC GmbH merged to PVA Tepla Analytical Instruments GmbH. The company continues the successful development and production of next generation scanning acoustic microscopes. |
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